Curved glide-reflection symmetry detection

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 34, Issue 2, 2012, Pages 266-278

  Lee, Seungkyu ^a   Liu, Yanxi ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

curved axis; curved surface; glide reflection; Symmetry

Indexed keywords

2D IMAGES; 3-D IMAGE; BIOMEDICAL IMAGING; CURVED AXIS; CURVED SURFACES; DETECTION RATES; EUCLIDEAN SPACES; FEATURE-BASED; POTENTIAL APPLICATIONS; QUANTITATIVE EVALUATION; REFLECTION SYMMETRY; SALIENCY DETECTION; STATE-OF-THE-ART ALGORITHMS; SURFACE DETECTION; SYMMETRY DETECTION;

ALGORITHMS; COMPUTER APPLICATIONS; COMPUTER VISION; CRYSTAL SYMMETRY; MEDICAL IMAGING; TWO DIMENSIONAL;

THREE DIMENSIONAL;

ALGORITHM; ANIMAL; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED TOMOGRAPHY; FACTUAL DATABASE; HUMAN; IMAGE PROCESSING; METHODOLOGY;

ALGORITHMS; ANIMALS; DATABASES, FACTUAL; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; TOMOGRAPHY, X-RAY COMPUTED;

EID: 84055217865     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2011.118     Document Type: Article

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