Finding axes of symmetry from potential fields

IEEE Transactions on Image Processing

Volumn 13, Issue 12, 2004, Pages 1559-1566

  Prasad, V Shiv Naga ^a,b   Yegnanarayana, B ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Axis of symmetry histogram; Bilateral symmetry; Gradient vector flow field; Potential field; Voting

Indexed keywords

BOUNDARY CONDITIONS; COMPUTATIONAL COMPLEXITY; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; VECTORS;

AXIS HISTOGRAM; BILATERAL SYMMETRY; GRADIENT VECTOR FIELD; MEDIAL AXIS TRANSFORM; POTENTIAL FIELD;

IMAGE PROCESSING;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; CLUSTER ANALYSIS; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER GRAPHICS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; MATHEMATICAL COMPUTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; CLUSTER ANALYSIS; COMPUTER GRAPHICS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; NUMERICAL ANALYSIS, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 9744266845     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2004.837564     Document Type: Article

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