Measurement of the spatial backscattering impulse-response at short length scales with polarized enhanced backscattering

Optics Letters

Volumn 36, Issue 24, 2011, Pages 4737-4739

  Radosevich, Andrew J ^a   Mutyal, Nikhil N ^a   Turzhitsky, Vladimir ^a   Rogers, Jeremy D ^a   Yi, Ji ^a   Taflove, Allen ^a   Backman, Vadim ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY FACTOR; EASY TO IMPLEMENT TECHNIQUES; ENHANCED BACKSCATTERINGS; EXPERIMENTAL MEASUREMENTS; FIRST MOMENTS; HIGHER ORDER; LENGTH SCALE; MONTE CARLO SIMULATION; POLARIZATION CHANNELS; SCATTERING PHASE FUNCTION; SHAPE PARAMETERS; SPECTROSCOPIC MEASUREMENTS; TRANSPORT MEAN FREE PATH; VISIBLE RANGE;

COMPUTER SIMULATION; MONTE CARLO METHODS; SPATIAL VARIABLES MEASUREMENT;

BACKSCATTERING;

ALGORITHM; ANISOTROPY; ARTICLE; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; EQUIPMENT DESIGN; LASER; METHODOLOGY; MONTE CARLO METHOD; OPTICS; OSCILLOMETRY; RADIATION SCATTERING; SPECTROPHOTOMETRY; STATISTICAL MODEL;

ALGORITHMS; ANISOTROPY; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; EQUIPMENT DESIGN; LASERS; MODELS, STATISTICAL; MONTE CARLO METHOD; OPTICS AND PHOTONICS; OSCILLOMETRY; SCATTERING, RADIATION; SPECTROPHOTOMETRY;

EID: 84055214108     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.004737     Document Type: Article

References (6)

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