Identification of impurity phases in Cu 2ZnSnS 4 thin-film solar cell absorber material by soft X-ray absorption spectroscopy

Materials Research Society Symposium Proceedings

Volumn 1324, Issue , 2012, Pages 91-96

  Bar M ^a   Schubert, B A ^a   Wilks, R G ^a   Marsen, B ^a   Zhang, Y ^b   Blum, M ^b,c   Krause, S ^b   Yang, W ^c   Unold, T ^a   Weinhardt, L ^d   Heske, C ^b   Schock, H W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF NEVADA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER SULFIDES; ELECTRON CONFIGURATION; IMPURITY PHASIS; INTERFACE CHARACTERIZATION; NEAR SURFACE REGIONS; SENSITIVE PROBE; SOFT X-RAY ABSORPTION SPECTROSCOPIES; SOFT-X-RAY ABSORPTION; THIN-FILM SOLAR CELLS;

COPPER OXIDES; ELECTROMAGNETIC WAVE ABSORPTION; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SOLAR ABSORBERS; SURFACE DEFECTS; SUSTAINABLE DEVELOPMENT; X RAY ABSORPTION SPECTROSCOPY;

COPPER;

EID: 84055200004     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2011.842     Document Type: Conference Paper

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