SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 105, Issue 2, 2011, Pages 283-288

High throughput combinatorial screening of semiconductor materials

(1) Mao, Samuel S a,b

a LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; COMBINATORIAL MATERIALS; COMBINATORIAL SCREENINGS; DIFFRACTION SYSTEMS; HIGH THROUGHPUT; LASER-ASSISTED EVAPORATION; MATRIX; MICRO BEAMS; SCANNING OPTICAL; THIN FILM MATERIAL; ULTRA-FAST; X RAY FLUORESCENCE;

ENERGY GAP; LIBRARIES; LIGHT TRANSMISSION; MATERIALS PROPERTIES; RADIATION DETECTORS; TRANSPORT PROPERTIES;

SEMICONDUCTOR MATERIALS;

EID: 83455230836 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-011-6614-7 Document Type: Article

Times cited : (17)

References (6)

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