Effect of temperature on the structure of charged membranes

Journal of Physical Chemistry B

Volumn 115, Issue 49, 2011, Pages 14501-14506

  Szekely, Pablo ^a   Dvir, Tom ^a   Asor, Roi ^a   Resh, Roi ^a   Steiner, Ariel ^a   Szekely, Or ^a   Ginsburg, Avi ^a,b   Mosenkis, Jonathan ^a   Guralnick, Vicky ^a   Dan, Yoav ^a   Wolf, Tamar ^a   Tamburu, Carmen ^a   Raviv, Uri ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; PHOSPHOLIPIDS; SCATTERING; TEMPERATURE; X RAY SCATTERING;

BILAYER THICKNESS; CHARGED MEMBRANES; COUNTERIONS; DIVALENT CATION; DIVALENT IONS; EFFECT OF TEMPERATURE; ELECTROSTATIC REPULSION; ELECTROSTATIC SCREENING; ELEVATED TEMPERATURE; HEAD GROUPS; PHOSPHOLIPID MEMBRANE; SELF-ASSEMBLED; SMALL ANGLE X-RAY SCATTERING; TEMPERATURE DEPENDENCE; TEMPERATURE RISE; WIDE ANGLE X-RAY SCATTERING;

MEMBRANES;

EID: 83455195510     PISSN: 15206106     EISSN: 15205207     Source Type: Journal    
DOI: 10.1021/jp207566n     Document Type: Article

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