X+: A comprehensive computationally accelerated structure analysis tool for solution X-ray scattering from supramolecular self-assemblies

Journal of Applied Crystallography

Volumn 43, Issue 6, 2010, Pages 1522-1531

  Ben Nun, Tal ^a   Ginsburg, Avi ^a   Székely, Pablo ^a   Raviv, Uri ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

background analysis; fitting error analysis; form factor analysis; line shape analysis; lipid membranes; microtubules; structure factor analysis

Indexed keywords

BACKGROUND ANALYSIS; FITTING-ERROR ANALYSIS; FORM-FACTOR ANALYSIS; LINE-SHAPE ANALYSIS; LIPID MEMBRANES; MICROTUBULES; STRUCTURE-FACTOR ANALYSIS;

AMORPHOUS ALLOYS; ERROR ANALYSIS; FEATURE EXTRACTION; GRAPHICAL USER INTERFACES; LIPID BILAYERS; LIPIDS; METALLIC GLASS; POLYDISPERSITY; SCATTERING; SELF ASSEMBLY; SIGNAL PROCESSING; SUPRAMOLECULAR CHEMISTRY; X RAY SCATTERING;

MULTICORE PROGRAMMING;

EID: 78649503199     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810032772     Document Type: Article

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