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Volumn 141, Issue 2-3, 2004, Pages 127-142

Reaction microscopes applied to study atomic and molecular fragmentation in intense laser fields: Non-sequential double ionization of helium

Author keywords

Non sequential double ionization; Reaction microscope; Recollision model

Indexed keywords

ELECTRON EMISSION; FUNCTIONS; HELIUM; IONIZATION; LASER PULSES; VECTORS;

EID: 8344282619     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.06.004     Document Type: Article
Times cited : (55)

References (74)
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    • submitted for publication (private communication)
    • K. Dimitriou, et al., submitted for publication (private communication).
    • Dimitriou, K.1
  • 60
    • 0034292786 scopus 로고    scopus 로고
    • J.S. Parker, et al., J. Phys. B 33 (2000) L691; J.S. Parker, et al., J. Phys. B 34 (2001) L69.
    • (2000) J. Phys. B , vol.33
    • Parker, J.S.1
  • 61
    • 0035250593 scopus 로고    scopus 로고
    • J.S. Parker, et al., J. Phys. B 33 (2000) L691; J.S. Parker, et al., J. Phys. B 34 (2001) L69.
    • (2001) J. Phys. B , vol.34
    • Parker, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.