CDF run IIb silicon: Design and testing
(94)
Lu, R S
a
Akimoto, T
b
Aoki, M
b
Azzi, P
c
Bacchetta, N
c
Behari, S
d
Benjamin, D
e
Bisello, D
c
Bolla, G
f
Bortoletto, D
f
Busetto, G
c
Cabrera, S
c
Canepa, A
f
Cardoso, G
g
Chertok, M
h
Ciobanu, C I
i
Derylo, G
g
Fang, I
g
Feng, E J
j
Fernandez, J P
f
Flaugher, B
g
Freeman, J
j
Galtieri, L
j
Galyardt, J
k
Garcia Sciveres, M
j
Giurgiu, G
k
Haber, C
j
Hale, D
l
Hara, K
b
Harr, R
m
Hill, C
l
Hoff, J
g
Holbrook, B
h
Hong, S C
n
Hrycyk, M
g
Hsiung, T H
i
Incandela, J
l
Jeon, E J
n
Joo, K K
n
Junk, T
i
Kahkola, H
o
Karjalainen, S
o
Kim, S
b
Kobayashi, K
p
Kong, D J
q
Krieger, B
j
Kruse, M
e
Kuznetsova, N
g
Kyre, S
l
Lander, R
h
Landry, T
h
Lauhakangas, R
r,s
Lee, J
n
Lujan, P J
j
Lukens, P
g
Mandelli, E
j
Manea, C
c
Maksimovic, P
d
Merkel, P
g,t
Min, S N
u
Moccia, S
g
Nakano, I
p
Nelson, T
g
Nord, B
d
Novak, J
f
Okusawa, T
v
Orava, R
r,s
Orlov, Y
g
Osterberg, K
r,s
Pantano, D
c
Pavlicek, V
g
Pellett, D
h
Pursley, J
d
Riipinen, P
o
Schuyler, B
d
Shenai, A
g
Soha, A
h
Stuart, D
l
Tanaka, R
p
Tavi, M
o
Von Der Lippe, H
j
Walder, J P
j
Wang, Z
c
Weber, M
j
Wester, W
g
Yamamoto, K
v
Yang, Y C
q
Yao, W
h,j
Yarema, R
g
Yun, J C
g
Zetti, F
j
Zimmerman, T
g
Zimmermann, S
j
Zucchelli, S
w
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