The direct measurement of spectral momentum densities of silicon with high energy (e, 2e) spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 141, Issue 2-3, 2004, Pages 95-104

  Bowles, C ^a   Kheifets, A S ^a   Sashin, V A ^a   Vos, M ^a   Weigold, E ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Band structure; Electron momentum spectroscopy; Silicon; Spectral function

Indexed keywords

BAND STRUCTURE; DIFFRACTION; ELECTRONS; FUNCTIONS; SAMPLING; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS;

ELECTRON MOMENTUM SPECTROSCOPY; MULTIPLE SCATTERING; SPECTRAL FUNCTION; SPECTRAL MOMENTUM;

SILICON;

EID: 8344241860     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.05.006     Document Type: Article

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