Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 12, 2003, Pages 2507-2515

  Vos, M ^a   Kheifets, A S ^a   Sashin, V A ^a   Weigold, E ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

C. Electron; Diffraction

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; SINGLE CRYSTALS;

ELECTRON TRAJECTORIES;

SEMICONDUCTING SILICON;

EID: 0142154064     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2003.08.004     Document Type: Article

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