Anodic oxide growth on tungsten studied by EQCM, EIS and AES

Corrosion Science

Volumn 46, Issue 10, 2004, Pages 2583-2600

  Verge M G ^a   Olsson, C O A ^a   Landolt, D ^a  

^a Laboratory of Mechanical Metallurgy Ecole Polytechnique Federale de Lausanne   (Switzerland)

Author keywords

Anodisation; Auger electron spectroscopy; EQCM; Passive oxide films; Tungsten

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTALS; ELECTRIC IMPEDANCE; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; GROWTH (MATERIALS); THICKNESS MEASUREMENT; TUNGSTEN;

ANODIC OXIDE GROWTH; ELECTROCHEMICAL QUARTZ CRYSTAL MICROBALANCE (EQCM); ROTATING ELECTRODES;

ANODIC OXIDATION;

OXIDANT;

EID: 8344229987     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2004.02.005     Document Type: Article

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