Depth profiling of W, O and H in tungsten trioxide thin films using RBS and ERDA techniques

Applied Surface Science

Volumn 93, Issue 1, 1996, Pages 45-52

  Bohnke, O ^a   Frand, G ^a   Fromm, M ^b   Weber, J ^c   Greim, O ^c  

^a UNIVERSITÉ DU MAINE   (France)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^c UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004726685     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00173-5     Document Type: Article

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