System identification algorithms for the analysis of dielectric responses from broadband spectroscopies

Journal of Physics: Conference Series

Volumn 310, Issue 1, 2011, Pages

  Hadjiloucas, S ^a   Walker, G C ^a   Bowen, J W ^a   Galvao R K H ^b  

^a UNIVERSITY OF READING   (United Kingdom)

^b INSTITUTO TECNOLÓGICO DE AERONÁUTICA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

IDENTIFICATION (CONTROL SYSTEMS);

BROAD-BAND SPECTROSCOPY; DIELECTRIC RESPONSE; FRACTIONAL ORDER; ORDERING DYNAMICS; STANDARD MODEL; SYSTEM IDENTIFICATION ALGORITHMS; SYSTEMS IDENTIFICATION;

DIELECTRIC MATERIALS;

EID: 83255188953     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/310/1/012002     Document Type: Conference Paper

References (33)

1. Galvão RKH, Hadjiloucas S, Bowen JW, and Coelho CJ, 2003 Opt. Express, 11, 1462-1473.
2. Hadjiloucas S, Galvão RKH and Bowen JW 2002 J. Opt. Soc. Am. A 19, 2495-2509.
3. Galvão, RKH, Hadjiloucas S, Zafiropoulos A, Walker GC, Bowen JW and Dudley R, 2007 Opt. Lett., 32, 3008-3010.
4. Hadjiloucas S, Galvão RKH, Becerra VM, Bowen JW, Martini R, Brucherseifer M, Pellemans HPM, Haring Bolívar P, Kurz H, Chamberlain JM 2004 IEEE Trans. Microw. Theory, 52, 2409-2419.
5. th Int.Conf. Terahertz Electronics, Caltech, USA.
6. Yin X, Fischer BM, Ng BW-H, Abbott D, Paiva HM, Galvão RKH, Hadjiloucas S, Walker GC and Bowen JW 2007 In Microelectronics: Design, Technology, and Packaging III, (Eds. Alex J. Hariz, Vijay K. Varadan), Proc. SPIE 6798, pp. 679814.
7. Hadjiloucas S, Walker GC, Bowen JW, Becerra VM, Zafiropoulos A and Galvão RKH 2009 J. Phys. Conf. Ser., 183 012003
8. Nowick AS, Vaysleyb AV and Kuskovsky I 1998 Phys. Rev. B, 58, pp. 8398-8406.
9. Panteny S, Stevens R and Bowen CR 2005 Ferroelectrics, 319, pp. 199-208.
10. Almond DP, Vainas B and Uvarov NF 1998 Solid State Ionics, 111, pp. 253-261.
11. Vainas B, Almond DP, Luo J and Stevens R 1999 Solid State Ionics, 126, pp. 65-80.
12. Almond DP, Bowen CR and Rees DAS 2006 J. Phy. D. Appl. Phys., 39, pp.1295-1304.
13. Bouamrane R and Almond DP 2003 J. Phys. Condens. Matt., 15, pp. 4089-4100.
14. McCullen NJ, Almond DP, Budd CJ and Hunt GW 2009 J. Phys. D Appl. Phys., 42, 064001.
15. Dyre JC 1991 J. Non-Crystal. Solids, 135, pp. 219-226.
16. Wieczorek W, Zalewska A, Siekierski M and Przyluski J 1996 Solid State Ionics, 86-88, pp. 357-362.
17. Nowick AS and Lim BS 2001 Phys. Rev. B, 63, 184115.
18. Sidebottom DL 1999 Phys. Rev. Lett., 83, pp. 983-986.
19. Jonscher AK 1977 'The universal dielectric response' Nature (London) 267, pp. 673-679.
20. A.K. Jonscher AK Dielectric Relaxation in Solids (Chelsea Dielectrics Press, London, 1983).
21. Hartley TT, Lorenzo CF, 2003 Signal Process., 83, pp. 2287-2300.
22. Matignon D 1998 Stability properties for generalized fractinal differential systems, In ESAIM: Proc. Fractional Differential Systems: Models, Methods and Applications, 5, 145-158.
23. van Overschee P and De Moor B 1994 Automatica 30 75-93
24. Katayama T (2005), Subspace methods for system identification, Springer.
25. Favoreel W, De Moor B, Van Overschee P 2000 J. Process Contr., 10, pp. 149-155.
26. Viberg M, 1995, Automatica, 31, 1835-1851.
27. Galvão RKH, Hadjiloucas S, Becerra VM and Bowen JW 2005 Meas. Sci. Technol., 16, 1037-1053.
28. th Int. Conf. Terahertz Electronics, Cardiff, UK pp.208-209 IEEE Cat. number 07EX1863.
29. Hadjiloucas S, Karatzas LS and Bowen JW 1999 IEEE Trans. Microw. Theory, 47, 142-149.
30. Walker 2003 GC 'Modelling the Propagation of Terahertz Radiation in Biological Tissue' PhD Thesis, Centre of Medical Imaging Research, University of Leeds.
31. th International Conference on Terahertz Electronics, Karlsruhe, Germany pp. 551-552, IEEE Catalog Number 04EX857.
32. th Int. Conf. Terahertz Electronics, Cardiff, UK pp. 512-513. IEEE Cat. number 07EX1863.
33. Bartels A, Cerna R, Kistner C, Thoma A, Hudert F, Janke C, and Dekorsy T 2007 Rev. Sci. Instrum. 78, 035107.