SCOPUS 정보 검색 플랫폼

Volumn 15, Issue 24, 2003, Pages 4089-4100

The 'emergent scaling' phenomenon and the dielectric properties of random resistor-capacitor networks

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAPACITORS; DIELECTRIC PROPERTIES; PERCOLATION (SOLID STATE); RANDOM PROCESSES; RESISTORS;

EMERGENT SCALING;

NETWORKS (CIRCUITS);

EID: 0038574008 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/15/24/302 Document Type: Article

Times cited : (56)

References (8)

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2
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3
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4
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5
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- Truong V T and Teran J G 1995 Polymer 36 905
- (1995) Polymer , vol.36 , pp. 905
- Truong, V.T.¹ Teran, J.G.²

6
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- Youngs I and Bleay S 2002 Mater. World 10 12
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- Youngs, I.¹ Bleay, S.²

7
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- Frank D J and Lobb C J 1988 Phys. Rev. B 37 302
- (1988) Phys. Rev. B , vol.37 , pp. 302
- Frank, D.J.¹ Lobb, C.J.²

8
- 0001598976
- Lobb C J and Frank D J 1984 Phys. Rev. B 30 4090
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- Lobb, C.J.¹ Frank, D.J.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.