X-ray interference effects on the determination of structural data in ultrathin La2/3Sr1/3MnO3 epitaxial thin films

Applied Physics Letters

Volumn 99, Issue 22, 2011, Pages

  Pesquera, D ^a   Marti, X ^b   Holy, V ^b   Bachelet, R ^a   Herranz, G ^a   Fontcuberta, J ^a  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CELL PARAMETER; DIFFRACTED WAVES; EPITAXIAL THIN FILMS; INTERFERENCE EFFECTS; SINGLE CRYSTALLINE SUBSTRATES; SRTIO; STRAIN EFFECT; STRUCTURAL DATA; STRUCTURAL SIMILARITY; ULTRA-THIN; UNIT CELL PARAMETERS; X-RAY DIFFRACTION DATA;

EPITAXIAL FILMS; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MANGANESE OXIDE; SUBSTRATES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ULTRATHIN FILMS;

EID: 82955241405     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3663574     Document Type: Article

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22. 2 used in our letter assumes only a two-beam interference. This simplification is applicable if the layer thickness is much smaller than the extinction length of x-rays in the layer material.