Structural characterization of ultrathin cuprate artificial superconducting structures by x-ray synchrotron radiation

Journal of Applied Physics

Volumn 94, Issue 10, 2003, Pages 6991-6993

  Aruta, C ^a   Angeloni, M ^b   Balestrino, G ^b   Medaglia, P G ^b   Orgiani, P ^b   Tebano, A ^b  

^a IMEM CNR   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; HETEROJUNCTIONS; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBSTRATES; SUPERCONDUCTING FILMS; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

ULTRATHIN STRUCTURES;

OXIDE SUPERCONDUCTORS;

EID: 0345377443     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1622989     Document Type: Article

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