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Volumn 19, Issue 25, 2011, Pages 24905-24921

A chip-scale integrated cavity-electro-optomechanics platform

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DEGREES OF FREEDOM (MECHANICS); MICROSENSORS; MICROWAVE SENSORS; RADIATION EFFECTS;

EID: 82955226375     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.024905     Document Type: Article
Times cited : (119)

References (39)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.