Multiple surface plasmon waves in [prism/Ag/SiO2 helical thin film] Kretschmann configuration

Thin Solid Films

Volumn 520, Issue 5, 2011, Pages 1451-1453

  Kim, Ji Bum ^a   Zou, Yu ^a,b   Kim, Young Deung ^a   Kim, Jin Joo ^a   Hwangbo, Chang Kwon ^a  

^a Inha University   (South Korea)

^b SICHUAN UNIVERSITY   (China)

Author keywords

Helical thin film; Multiple surface plasmon waves; Oblique angle deposition

Indexed keywords

ANGULAR POSITIONS; ANGULAR SPECTRA; BIOSENSING; INCIDENT BEAMS; KRETSCHMANN CONFIGURATION; MULTIPLE SURFACES; OBLIQUE-ANGLE DEPOSITION; P-POLARIZED; REFLECTANCE SPECTRUM; SURFACE PLASMON WAVES;

DEPOSITION; INTERFACES (MATERIALS); REFLECTION; REFRACTIVE INDEX; SPECTRUM ANALYSIS; SURFACE PLASMON RESONANCE; THIN FILMS; VAPOR DEPOSITION;

PLASMONS;

EID: 82755176330     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.10.001     Document Type: Conference Paper

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