Time- and angle-resolved x-ray diffraction to probe structural and chemical evolution during Al-Ni intermetallic reactions

Review of Scientific Instruments

Volumn 82, Issue 11, 2011, Pages

  Yoo, Choong Shik ^a   Wei, Haoyan ^a   Chen, Jing Yin ^a   Shen, Guoyin ^b   Chow, Paul ^b   Xiao, Yuming ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADIABATIC HEATING; CHEMICAL EVOLUTION; CONDUCTIVE COOLING; DIFFRACTION BEAMS; INTERMETALLIC REACTION; MULTIPLE-FRAME; NIAL ALLOY; OPTICAL PYROMETERS; PIXEL ARRAYS; PROPAGATION SPEED; REACTION CHARACTERISTICS; SYNCHROTRON X RAYS; TEMPERATURE DATA; THERMAL EXPANSION COEFFICIENTS; TIME RESOLUTION; TIME-DEPENDENT; TIME-PERIODS; X-RAY DETECTOR;

ALUMINUM; PYROMETERS; THERMAL EXPANSION; X RAY DIFFRACTION;

VANADIUM;

EID: 82555182694     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3658817     Document Type: Article

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