A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity

Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

  Dai, Yeling ^a   Lin, Binhua ^b   Meron, Mati ^b   Kim, Kyungil ^b   Leahy, Brian ^b   Shpyrko, Oleg G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING STIFFNESS; COMPARATIVE STUDIES; DENSITY PROFILE; ELECTRON DENSITY PROFILES; GRAZING INCIDENCE; HIGHLY SENSITIVE; IN-PLANE; LANGMUIRS; MONOLAYER THICKNESS; NANO SCALE; NANOSCALE STRUCTURE; OFF-SPECULAR SCATTERING; OUT-OF-PLANE; RESOLUTION EFFECTS; SHORT WAVELENGTHS; SPECULAR X-RAY REFLECTIVITIES; STRUCTURAL CHARACTERISTICS; SURFACE MONOLAYERS; SURFACTANT FILMS; X RAY REFLECTIVITY; X-RAY REFLECTIVITY MEASUREMENTS; X-RAY SPECULAR REFLECTIVITY;

CARRIER CONCENTRATION; DIELECTRIC MATERIALS; ELECTRON DENSITY MEASUREMENT; MECHANICAL PROPERTIES; NANOTECHNOLOGY; NEUTRON SCATTERING; OPTICS; PHOSPHOLIPIDS; REFLECTION; SELF ASSEMBLED MONOLAYERS; SURFACE ACTIVE AGENTS; SURFACE STRUCTURE; TWO DIMENSIONAL;

X RAYS;

EID: 82555167438     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3661980     Document Type: Conference Paper

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