Effects of thermal roughness on X-ray studies of liquid surfaces

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 171, Issue 1-3, 2000, Pages 149-157

  Pershan, P S ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

Cutoff; Liquid; X ray

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL LATTICES; LIQUIDS; MATHEMATICAL MODELS; THERMAL EFFECTS; X RAY SCATTERING;

THERMAL ROUGHNESS; X RAY REFLECTIVITY;

SURFACE STRUCTURE;

ANALYTIC METHOD; ARTICLE; COLLOID; CORRELATION FUNCTION; LIQUID; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; SURFACE PROPERTY; X RAY ANALYSIS;

EID: 0034634057     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(99)00557-9     Document Type: Article

References (15)

1. Als-Nielsen J., Christensen F., Pershan P.S. Phys. Rev. Lett. 48:1982;1107.
2. Pershan P.S., Als-Nielsen J. Phys. Rev. Lett. 52:1984;759.
3. Pershan P.S. Phys. Rev. E50:1994;2369.
4. Sinha S.K., Sirota E.B., Garoff S. et al. Phys. Rev. B. 38:1988;2297.
5. Tostmann H., DiMasi E., Pershan P.S. et al. Phys. Rev. B. 59:1999;783.
6. Fukuto M., Heilmann R.K., Pershan P.S. et al. Phys. Rev. Lett. 81:1998;3455.
7. Yoneida Y. Phys. Rev. 131:1963;2010.
8. Schwartz D.K., Schlossman M.L., Kawamoto E.H. et al. Phys. Rev. A. 41:1990;5687.
9. Braslau A., Deutsch M., Pershan P.S. et al. Phys. Rev. Lett. 54:1985;114.
10. Braslau A., Pershan P.S., Swislow G. et al. Phys. Rev. A. 38:1988;2457.
11. Daillant J., Bosio L., Harzallah B. et al. J. Phys. II. 1:1991;149.
12. Martin P.C., Parodi O., Pershan P.S. Phys. Rev. A. 6:1972;2401.
13. H. Tostmann, E. DiMasi, B.M. Ocko, M. Dentsch, P.S. Pershan, J. Non-Cryst. Solids (1998) 250. (1999).
14. Tostmann H., DiMasi E., Ocko B.M., Dentsch M., Pershan P.S. J. Non-Cryst. Solids. 1999:1998;250.
15. Rice S.A. Proc. Natl. Acad. Sci. USA. 84:1987;4709.