Transmission electron microscopy based direct mathematical quantifiers for dispersion in nanocomposites

Applied Physics Letters

Volumn 91, Issue 5, 2007, Pages

  Basu, S K ^a   Tewari, A ^a   Fasulo, P D ^a   Rodgers, W R ^a  

^a GENERAL MOTORS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXFOLIATION NUMBER; INTERPARTICLE DISTANCE; MATHEMATICAL QUANTIFIERS; MICROGRAPHS;

CHARACTERIZATION; CLAY; MICROSTRUCTURE; PHASE SEPARATION; RHEOLOGY; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

NANOCOMPOSITES;

EID: 34547664913     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2760182     Document Type: Article

References (10)

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