SCOPUS 정보 검색 플랫폼

Volumn 23, Issue 44, 2011, Pages 5268-5274

Tailoring interface structure in highly strained YSZ/STO heterostructures

(16) Rivera Calzada, A a Diaz Guillen, M R a Dura, O J a Sanchez Santolino, G d Pennycook, T J c Schmidt, R a Bruno, F Y a Garcia Barriocanal, J a Sefrioui, Z a Nemes, N M a Garcia Hernandez, M b Varela, M d Leon, C a Pantelides, S T c Pennycook, S J d Santamaria, J a

a UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

c VANDERBILT UNIVERSITY (United States)

d OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

charge transport; epitaxy; structure property relationships; thin films

Indexed keywords

DENSITY FUNCTIONAL THEORY CALCULATIONS; DIFFUSIVITIES; ENERGY GENERATIONS; EPITAXIAL STRAIN; GROWTH ORIENTATIONS; HIGHLY STRAINED; INTERFACE PLANES; INTERFACE STRUCTURES; ION CONDUCTIVITIES; STRAINED INTERFACES; STRUCTURAL DOMAINS; STRUCTURE AND MORPHOLOGY; STRUCTURE-PROPERTY RELATIONSHIPS; TRANSITION-METAL OXIDES;

CHARGE TRANSFER; CRYSTALS; DENSITY FUNCTIONAL THEORY; EPITAXIAL GROWTH; IONIC CONDUCTIVITY; IONS; SUPERLATTICES; THIN FILMS; TRANSITION METAL COMPOUNDS; TRANSITION METALS;

INTERFACES (MATERIALS);

OXIDE; STRONTIUM; STRONTIUM TITANIUM OXIDE; TITANIUM; YTTRIA STABILIZED TETRAGONAL ZIRCONIA; YTTRIUM; ZIRCONIUM;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; MECHANICAL STRESS; TEMPERATURE; X RAY DIFFRACTION;

ELECTRIC CONDUCTIVITY; OXIDES; STRESS, MECHANICAL; STRONTIUM; TEMPERATURE; TITANIUM; X-RAY DIFFRACTION; YTTRIUM; ZIRCONIUM;

EID: 81555200966 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201102106 Document Type: Article

Times cited : (35)

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