-
1
-
-
52749097196
-
n misfit layered compounds
-
n misfit layered compounds. J. Solid State Chem. 181, 1701 (2008).
-
(2008)
J. Solid State Chem.
, vol.181
, pp. 1701
-
-
Heideman, C.1
Nyugen, N.2
Hanni, J.3
Lin, Q.4
Duncombe, S.5
Johnson, D.C.6
Zschack, P.7
-
2
-
-
53249121854
-
Designed synthesis of families of misfit-layered compounds
-
Q. Lin, C.L. Heideman, N. Nguyen, P. Zschack, C. Chiritescu, D.G. Cahill, and D.C. Johnson: Designed synthesis of families of misfit-layered compounds. Eur. J. Inorg. Chem. 2008, 2382 (2008).
-
(2008)
Eur. J. Inorg. Chem.
, vol.2008
, pp. 2382
-
-
Lin, Q.1
Heideman, C.L.2
Nguyen, N.3
Zschack, P.4
Chiritescu, C.5
Cahill, D.G.6
Johnson, D.C.7
-
3
-
-
76249110674
-
n
-
n. Chem. Mater. 22, 1002 (2010).
-
(2010)
Chem. Mater.
, vol.22
, pp. 1002
-
-
Lin, Q.1
Smeller, M.2
Heideman, C.L.3
Zschack, P.4
Koyano, M.5
Anderson, M.D.6
Kykyneshi, R.7
Keszler, D.A.8
Anderson, I.M.9
Johnson, D.C.10
-
4
-
-
0002394004
-
Misfit layered compounds: Structures and physical properties
-
G.A. Wiegers: Misfit layered compounds: Structures and physical properties. Prog. Solid State Chem. 24, 1 (1996).
-
(1996)
Prog. Solid State Chem.
, vol.24
, pp. 1
-
-
Wiegers, G.A.1
-
5
-
-
0000065773
-
Control of reaction pathway and the nanostructure of final products through the design of modulated elemental reactants
-
M. Noh, C.D. Johnson, M.D. Hornbostel, J. Thiel, and D.C. Johnson: Control of reaction pathway and the nanostructure of final products through the design of modulated elemental reactants. Chem. Mater. 8, 1625 (1996).
-
(1996)
Chem. Mater.
, vol.8
, pp. 1625
-
-
Noh, M.1
Johnson, C.D.2
Hornbostel, M.D.3
Thiel, J.4
Johnson, D.C.5
-
6
-
-
49749095148
-
Low thermal conductivity in nanoscale layered materials synthesized by the method of modulated elemental reactants
-
C. Chiritescu, D.G. Cahill, C. Heideman, Q. Lin, C. Mortensen, N.T. Nguyen, D.C. Johnson, R. Rostek, and H. Böttner: Low thermal conductivity in nanoscale layered materials synthesized by the method of modulated elemental reactants. J. Appl. Phys. 104, 033533 (2008).
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 033533
-
-
Chiritescu, C.1
Cahill, D.G.2
Heideman, C.3
Lin, Q.4
Mortensen, C.5
Nguyen, N.T.6
Johnson, D.C.7
Rostek, R.8
Böttner, H.9
-
7
-
-
77952808389
-
x superlattice thin films
-
x superlattice thin films. Appl. Phys. Lett. 96, 181908 (2010).
-
(2010)
Appl. Phys. Lett.
, vol.96
, pp. 181908
-
-
Mavrokefalos, A.1
Lin, Q.2
Beekman, M.3
Seol, J.H.4
Lee, Y.J.5
Kong, H.6
Pettes, M.T.7
Johnson, D.C.8
Shi, L.9
-
8
-
-
33846602674
-
2 crystals
-
2 crystals. Science 135, 351 (2007).
-
(2007)
Science
, vol.135
, pp. 351
-
-
Chiritescu, C.1
Cahill, D.G.2
Nguyen, N.3
Johnson, D.4
Bodapati, A.5
Keblinski, P.6
Zschack, P.7
-
10
-
-
0016058014
-
Heat treatment of galliumphosphide
-
J.-I. Nishizawa, Y. Okuno, K. Suto, T. Sato, and S. Yamokoshi: Heat treatment of galliumphosphide. Solid State Commun. 14, 889 (1974).
-
(1974)
Solid State Commun.
, vol.14
, pp. 889
-
-
Nishizawa, J.-I.1
Okuno, Y.2
Suto, K.3
Sato, T.4
Yamokoshi, S.5
-
11
-
-
0001590118
-
Thermal properties of high quality single crystals of bismuth telluride-part I: Experimental characterization
-
J.P. Fleurial, L. Gailliard, R. Triboulet, H. Scherrer, and S. Scherrer: thermal properties of high quality single crystals of bismuth telluride-part I: Experimental characterization. J. Phys. Chem. Solids 49, 1237 (1988).
-
(1988)
J. Phys. Chem. Solids
, vol.49
, pp. 1237
-
-
Fleurial, J.P.1
Gailliard, L.2
Triboulet, R.3
Scherrer, H.4
Scherrer, S.5
-
14
-
-
13744257636
-
-
Springer-Velag, New York
-
U. Pietsch, V. Holý, and T. Baumbach: High Resolution X-ray Scattering, 2nd ed. (Springer-Velag, New York, 2004).
-
(2004)
High Resolution X-ray Scattering, 2nd Ed.
-
-
Pietsch, U.1
Holý, V.2
Baumbach, T.3
-
15
-
-
67650474073
-
X-ray characterization of low thermal conductivity thin film materials
-
P. Zschack, C. Heideman, C. Mortensen, N. Nguyen, M. Smeller, Q. Lin, and D.C. Johnson: X-ray characterization of low thermal conductivity thin film materials. J. Electron. Mater. 38, 1402 (2009).
-
(2009)
J. Electron. Mater.
, vol.38
, pp. 1402
-
-
Zschack, P.1
Heideman, C.2
Mortensen, C.3
Nguyen, N.4
Smeller, M.5
Lin, Q.6
Johnson, D.C.7
-
16
-
-
0000426541
-
X-ray reflection studies of anneal and oxidation of some thin solid films
-
N. Wainfan and L.G. Parratt: X-ray reflection studies of anneal and oxidation of some thin solid films. J. Appl. Phys. 31, 1331 (1960).
-
(1960)
J. Appl. Phys.
, vol.31
, pp. 1331
-
-
Wainfan, N.1
Parratt, L.G.2
-
17
-
-
74349099520
-
Improvement of the thermoelectric power factor through anisotropic growth of nanostructured PbSe thin films
-
X. Qiu, Y. Zhao, I.M. Steward, J.S. Dyck, and C. Burda: Improvement of the thermoelectric power factor through anisotropic growth of nanostructured PbSe thin films. Dalton Trans. 39, 1095 (2010).
-
(2010)
Dalton Trans.
, vol.39
, pp. 1095
-
-
Qiu, X.1
Zhao, Y.2
Steward, I.M.3
Dyck, J.S.4
Burda, C.5
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