Rational synthesis and characterization of a new family of low thermal conductivity misfit layer compounds [(PbSe)0.99]m(WSe2)n'

Chemistry of Materials

Volumn 22, Issue 3, 2010, Pages 1002-1009

  Lin, Qiyin ^a   Smeller, Mary ^a   Heideman, Colby L ^a   Zschack, Paul ^b   Koyano, Mikio ^c   Anderson, Michael D ^a,e   Kykyneshi, Robert ^d   Keszler, Douglas A ^d   Anderson, Ian M ^e   Johnson, David C ^a  

^a UNIVERSITY OF OREGON   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c School of Materials Science   (Japan)

^d OREGON STATE UNIVERSITY   (United States)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL ELECTRON MICROSCOPY; BI-LAYER; COMPOSITION PROFILE; IN-PLANE LATTICE PARAMETERS; LATTICE PARAMETERS; LOW THERMAL CONDUCTIVITY; MISFIT-LAYER COMPOUNDS; RATIONAL SYNTHESIS; ROCK SALT; STRUCTURAL EVOLUTION; TRILAYERS; TURBOSTRATIC; X-RAY DIFFRACTION DATA;

DIFFRACTION; LATTICE CONSTANTS; LEAD; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COMPLEXATION;

EID: 76249110674     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm901952v     Document Type: Article

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