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Volumn 58, Issue 11, 2011, Pages 2469-2474
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Determination of mass density, dielectric, elastic, and piezoelectric constants of bulk GaN crystal
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC CONSTANTS;
ELECTROMECHANICAL COUPLING COEFFICIENTS;
FREE SPACE;
GAN CRYSTALS;
INTERDIGITAL TRANSDUCER;
MASS DENSITIES;
PARALLEL PLATE CAPACITORS;
PIEZOELECTRIC CONSTANT;
RELATIVE DIELECTRIC CONSTANT;
ACOUSTIC SURFACE WAVE DEVICES;
ELECTRIC FIELDS;
ELECTROMECHANICAL COUPLING;
GALLIUM NITRIDE;
ULTRASONIC TRANSDUCERS;
PIEZOELECTRICITY;
GALLIUM;
GALLIUM NITRIDE;
ARTICLE;
CHEMICAL MODEL;
CHEMISTRY;
COMPUTER SIMULATION;
CRYSTALLIZATION;
DENSITOMETRY;
IMPEDANCE;
MATERIALS TESTING;
METHODOLOGY;
VIBRATION;
YOUNG MODULUS;
COMPUTER SIMULATION;
CRYSTALLIZATION;
DENSITOMETRY;
ELASTIC MODULUS;
ELECTRIC IMPEDANCE;
GALLIUM;
MATERIALS TESTING;
MODELS, CHEMICAL;
VIBRATION;
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EID: 81355138413
PISSN: 08853010
EISSN: None
Source Type: Journal
DOI: 10.1109/TUFFC.2011.2103 Document Type: Article |
Times cited : (16)
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References (10)
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