A multiscale design approach with random field representation of material uncertainty

Proceedings of the ASME Design Engineering Technical Conference

Volumn 1, Issue PARTS A AND B, 2008, Pages 113-122

  Yin, Xiaolei ^a   Lee, Sanghoon ^a   Chen, Wei ^a   Liu, Wing Kam ^a   Horstemeyer, M F ^b  

^a Northwestern University   (United States)

^b MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CASTING PROCESS; CRITICAL INFORMATION; DESIGN UNDER UNCERTAINTY; DIMENSION REDUCTION METHOD; DISCRETIZATION SCHEME; END-PRODUCTS; FINITE ELEMENT MESHES; GAUSSIAN QUADRATURE FORMULA; INFORMATION FLOWS; KARHUNEN LOEVE EXPANSION; MANUFACTURING PROCESS; MATERIAL MICROSTRUCTURES; MATERIAL UNCERTAINTY; MICRO-SCALES; MULTI-SCALE DESIGN; PRODUCT DAMAGE; PRODUCT MANUFACTURING; PRODUCT PERFORMANCE; RANDOM FIELDS; REDUCED ORDER; RELIABILITY BASED DESIGN; STATISTICAL MOMENTS; UNCERTAINTY PROPAGATION; UNIVARIATE;

COMPUTER AIDED DESIGN; INDUSTRIAL ENGINEERING; MATERIALS; NANOELECTRONICS; PRODUCTION ENGINEERING;

MANUFACTURE;

EID: 81255201093     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC2008-49560     Document Type: Conference Paper

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