New method for fabrication of Co3O4 thin film sensors: Structural, morphological and optoelectronic properties

Sensors and Transducers

Volumn 128, Issue 5, 2011, Pages 100-114

  Patil, Vikas ^a   Pawar, Shailesh ^a   Chougule, Manik ^a   Raut, Bharat ^a   Mulik, Ramesh ^a   Sen, Shashwati ^b  

^a SOLAPUR UNIVERSITY   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Co3O4 Sensor; Electrical properties; Optical properties; Structural properties

Indexed keywords

ABSORPTION COEFFICIENTS; ANNEALING TEMPERATURES; CONDUCTIVITY MEASUREMENTS; CUBIC SPINEL STRUCTURE; DC ELECTRICAL CONDUCTIVITY; GAS SENSING; GAS SENSING PROPERTIES; HIGH SENSITIVITY; NANOCRYSTALLINE CO; NANOCRYSTALLINE GRAINS; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL BAND GAP ENERGY; OPTICAL QUALITIES; OPTOELECTRONIC APPLICATIONS; OPTOELECTRONIC PROPERTIES; RANDOM ORIENTATIONS; THIN FILM ANNEALING; THIN FILM SENSORS; X-RAY DIFFRACTION STUDIES;

ANNEALING; CARRIER CONCENTRATION; CARRIER MOBILITY; COBALT COMPOUNDS; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ENERGY GAP; MORPHOLOGY; OPTICAL BAND GAPS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SENSORS; STRUCTURAL PROPERTIES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COBALT;

EID: 81255134572     PISSN: None     EISSN: 17265479     Source Type: Trade Journal    
DOI: None     Document Type: Article

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