-
1
-
-
34248676310
-
Active matrix LCD with integrated optical touch screen
-
W. den Boer, A. Abileah, P. Green, T. Larsson, S. Robinson, and T. Nguyen, "Active matrix LCD with integrated optical touch screen," in SID'03 Dig., 2003, pp. 1494-1497.
-
(2003)
SID'03 Dig.
, pp. 1494-1497
-
-
Den Boer, W.1
Abileah, A.2
Green, P.3
Larsson, T.4
Robinson, S.5
Nguyen, T.6
-
2
-
-
34548861324
-
Integrated optical touch panel in a 14.1 AMLCD
-
A. Abileah, W. den Boer, T. Larsson, T. Baker, S. Robinson, R. Siegel, N. Fickenscher, B. Leback, T. Griffin, and P. Green, "Integrated optical touch panel in a 14.1 AMLCD," in SID'04 Dig., 2004, pp. 1544-1577.
-
(2004)
SID'04 Dig.
, pp. 1544-1577
-
-
Abileah, A.1
Den Boer, W.2
Larsson, T.3
Baker, T.4
Robinson, S.5
Siegel, R.6
Fickenscher, N.7
Leback, B.8
Griffin, T.9
Green, P.10
-
3
-
-
0027187625
-
Two-dimensional contacttype image sensor using amorphous silicon photo-transistor
-
M. Yamaguchi, Y. Kaneko, and K. Tsutsui, "Two-dimensional contacttype image sensor using amorphous silicon photo-transistor," Jpn. J. Appl. Phy., vol. 32, no. 1B, 1993.
-
(1993)
Jpn. J. Appl. Phy.
, vol.32
, Issue.1 B
-
-
Yamaguchi, M.1
Kaneko, Y.2
Tsutsui, K.3
-
4
-
-
81155147266
-
-
U.S. Patent 4 419 696, Dec. 6
-
T. Hamano, H. Ito, M. Takenouchi, T. Ozawa, M. Fuse, and T. Nakamura, "Elongate thin-film reader," U.S. Patent 4 419 696, Dec. 6, 1983.
-
(1983)
Elongate Thin-Film Reader
-
-
Hamano, T.1
Ito, H.2
Takenouchi, M.3
Ozawa, T.4
Fuse, M.5
Nakamura, T.6
-
5
-
-
3943071446
-
The photosensitivity of amorphous silicon thin film transistors
-
C. Van Berkel and M. J. Powell, "The photosensitivity of amorphous silicon thin film transistors," J. Non-Crystalline Solids, vol. 77-78, no. 2, pp. 1393-1396, 1985.
-
(1985)
J. Non-Crystalline Solids
, vol.77-78
, Issue.2
, pp. 1393-1396
-
-
Van Berkel, C.1
Powell, M.J.2
-
6
-
-
38949129105
-
A coplanar hydrogenated amorphous silicon thin-film transistor for controlling backlight brightness of liquid-crystal display
-
DOI 10.1016/j.sse.2007.10.015, PII S003811010700384X
-
S. H. Kim, E. B. Kim, H. Y. Choi, M. H. Kang, J. H. Hur, and J. Jang, "A coplanar hydrogenated amorphous silicon thin-film transistor for controlling backlight brightness of liquid-crystal display," Solid-State Electron., vol. 52, no. 3, pp. 478-481, 2008. (Pubitemid 351226147)
-
(2008)
Solid-State Electronics
, vol.52
, Issue.3
, pp. 478-481
-
-
Kim, S.H.1
Kim, E.B.2
Choi, H.Y.3
Kang, M.H.4
Hur, J.H.5
Jang, J.6
-
8
-
-
0031246972
-
The source-gated amorphous silicon photo-transistor
-
PII S0018938397069372
-
S. M. Gadelrab and S. G. Chamberlain, "The source-gated amorphous silicon photo-transistor," IEEE Trans. on Electron Devices, vol. 44, no. 10, pp. 1789-1794, Oct. 1997. (Pubitemid 127764718)
-
(1997)
IEEE Transactions on Electron Devices
, vol.44
, Issue.10
, pp. 1789-1794
-
-
Gadelrab, S.M.1
Chamberlain, S.G.2
-
9
-
-
0019026937
-
Optically induced conductivity changes in discharge-produced hydrogenated amorphous silicon
-
DOI 10.1063/1.328084
-
D. L. Staebler and C. R. Wronski, "Optically induced conductivity changes in discharge-produced hydrogenated amorphous silicon," J. Appl. Phys., vol. 51, no. 6, pp. 3262-3268, 1980. (Pubitemid 11441235)
-
(1980)
Journal of Applied Physics
, vol.51
, Issue.6
, pp. 3262-3268
-
-
Staebler, D.L.1
Wronski, C.R.2
-
10
-
-
0029406892
-
Direct measurement of the deep defect density in thin amorphous silicon films with the absolute constant photocurrent method
-
M. Vanecek, A. Poruba, A. Fejfar, and J. Kocka, "Direct measurement of the deep defect density in thin amorphous silicon films with the absolute constant photocurrent method," Jpn.. Soc. Appl. Phys., vol. 78, no. 10, pp. 6203-6210, 1995.
-
(1995)
Jpn. Soc. Appl. Phys.
, vol.78
, Issue.10
, pp. 6203-6210
-
-
Vanecek, M.1
Poruba, A.2
Fejfar, A.3
Kocka, J.4
-
11
-
-
33645668668
-
On the origin of the Staebler-Wronski effect
-
Mar.
-
T. Kruger, "On the origin of the Staebler-Wronski effect," J. Appl. Phys., vol. 99, no. 6, p. 063509, Mar. 2006.
-
(2006)
J. Appl. Phys.
, vol.99
, Issue.6
, pp. 063509
-
-
Kruger, T.1
-
12
-
-
33750304873
-
Study of the long-term behavior of the sensitivity of amorphous silicon photo detectors under illumination
-
DOI 10.1016/j.nima.2006.05.198, PII S0168900206010813
-
L. Eglseer, S. Horvat, and H. Kroha, "Study of the long-term behavior of the sensitivity of amorphous silicon photo detectors under illumination," in Eur. Symp. on Semiconductor Detectors, Nov. 2006, vol. 568, no. 1, pp. 18-21. (Pubitemid 44635919)
-
(2006)
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
, vol.568
, Issue.1
, pp. 18-21
-
-
Eglseer, L.1
Horvat, S.2
Kroha, H.3
-
13
-
-
81155141891
-
-
U.S. Patent 5 153 420, Oct. 6
-
M. Hack, A. G. Lewis, and R. H. Bruce, "Timing independent pixelscale light sensing apparatus," U.S. Patent 5 153 420, Oct. 6, 1992.
-
(1992)
Timing Independent Pixelscale Light Sensing Apparatus
-
-
Hack, M.1
Lewis, A.G.2
Bruce, R.H.3
-
15
-
-
32144445604
-
Advanced method for motion-blur reduction in LCDs
-
DOI 10.1889/1.2036474, P-51, SID Symposium Digest of Technical Papers - May 2005
-
S. Hong, B. H. Shin, T.-S. Kim, B. Berkeley, and S. S. Kim, "Advanced method for motion-blur reduction in LCDs," in SID'05 Dig., 2005, pp. 466-469. (Pubitemid 43208389)
-
(2005)
Digest of Technical Papers - SID International Symposium
, vol.36
, Issue.1
, pp. 466-469
-
-
Hong, S.1
Shin, B.H.2
Kim, T.-S.3
Berkeley, B.4
Kim, S.S.5
|