Polycrystal deformation analysis by high energy synchrotron X-ray diffraction on the I12 JEEP beamline at Diamond Light Source

Materials Letters

Volumn 64, Issue 15, 2010, Pages 1724-1727

  Korsunsky, Alexander M ^a   Song, Xu ^a   Hofmann, Felix ^a   Abbey, Brian ^a   Xie, Mengyin ^a   Connolley, Thomas ^b   Reinhard, Christina ^b   Atwood, Robert C ^b   Connor, Leigh ^b   Drakopoulos, Michael ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Diffraction; Energy dispersive synchrotron X ray; Polycrystal; Residual stress

Indexed keywords

ANISOTROPY; DEFORMATION; DIFFRACTION; HARDENING; LIGHT SOURCES; POLYCRYSTALLINE MATERIALS; POLYCRYSTALS; RESIDUAL STRESSES; STRAIN; SYNCHROTRON RADIATION; TITANIUM ALLOYS;

DEFORMATION ANALYSIS; DEFORMATION RESPONSE; DIAMOND LIGHT SOURCE; HIGH-ENERGY SYNCHROTRON X-RAYS; MULTIPHASE MATERIALS; SYNCHROTRON BEAMLINES; SYNCHROTRON X RAYS; UNIT CELL PARAMETERS;

X RAY DIFFRACTION;

EID: 80855129377     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2010.04.023     Document Type: Article

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