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Volumn 526, Issue 1-2, 2011, Pages 58-64

Verifying the symmetry of ultra-fast scanning calorimeters using liquid crystal secondary temperature standards

Author keywords

Calibration; Fast scanning calorimetry; Liquid crystal standard; Symmetry

Indexed keywords

CHIP CALORIMETER; CYCLOHEXYL; FAST SCANNING; LIQUID CRYSTAL MATERIALS; LIQUID CRYSTAL PHASE; META-STABLE STATE; MULTIPLE-PEAK; NEMATIC-TO-ISOTROPIC TRANSITIONS; RAPID DEVELOPMENT; RATE DEPENDENCE; SCANNING RATE; SECONDARY STANDARD; STRUCTURAL REORGANIZATION; TEMPERATURE CALIBRATION; TEMPERATURE STANDARD; ULTRA-FAST;

EID: 80455154966     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tca.2011.08.020     Document Type: Article
Times cited : (15)

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