Wavelet-based moment invariants for pattern recognition

Optical Engineering

Volumn 50, Issue 7, 2011, Pages

  Chen, Guangyi ^a   Xie, Wenfang ^a  

^a Dept of Electrical and Computer Engineering   (Canada)

Author keywords

Auto correlation of wavelet transform; Dual tree complex wavelet transform; Gaussian white noise; Invariant features; Optical character recognition; Pattern recognition; Wavelet transform; Zernikes moments

Indexed keywords

AUTO-CORRELATION OF WAVELET TRANSFORM; DUAL-TREE COMPLEX WAVELET TRANSFORM; GAUSSIAN WHITE NOISE; INVARIANT FEATURES; ZERNIKES MOMENTS;

FEATURE EXTRACTION; GAUSSIAN NOISE (ELECTRONIC); OPTICAL CHARACTER RECOGNITION; PARTIAL DISCHARGES; ROTATION; SIGNAL TO NOISE RATIO; WHITE NOISE;

WAVELET TRANSFORMS;

EID: 80455141692     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.3597329     Document Type: Article

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