Rotation invariant pattern recognition using ridgelets, wavelet cycle-spinning and Fourier features

Pattern Recognition

Volumn 38, Issue 12, 2005, Pages 2314-2322

  Chen, G Y ^a   Bui, T D ^a   Krzyzak, A ^a  

^a Dept of Electrical and Computer Engineering   (Canada)

Author keywords

Cycle spinning; Feature extraction; Fourier transform; Pattern recognition; Ridgelets; Wavelets

Indexed keywords

ALGORITHMS; FEATURE EXTRACTION; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; TOPOLOGY; WAVELET TRANSFORMS;

CYCLE-SPINNING; RIDGELETS; WAVELETS;

PATTERN RECOGNITION;

EID: 25144525211     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2005.02.008     Document Type: Article

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