Angular resolution measurements at SPring-8 of a hard X-ray optic for the new hard X-ray mission

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8147, Issue , 2011, Pages

  Spiga, D ^a   Raimondi, L ^a,b   Furuzawa, A ^c   Basso, S ^a   Binda, R ^d   Borghi, G ^d   Cotroneo, V ^e   Grisoni, G ^d   Kunieda, H ^c   Marioni, F ^d   Matsumoto, H ^c   Mori, H ^c   Miyazawa, T ^c   Negri, B ^f   Orlandi, A ^d   Pareschi, G ^a   Salmaso, B ^a   Tagliaferri, G ^a   Uesugi, K ^g   Valsecchi, G ^d   Vernani, D ^d   more..

^a INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

^b UNIVERSITY OF INSUBRIA   (Italy)

^c NAGOYA UNIVERSITY   (Japan)

^d Media Lario Technologies   (Italy)

^e HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^f ITALIAN SPACE AGENCY   (Italy)

^g JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Hard X ray optics; NHXM; optics calibration; SPring 8

Indexed keywords

ANGULAR RESOLUTION; BEAM DIVERGENCE; BEAM LINES; DOUBLE REFLECTIONS; EFFECTIVE AREA; ENERGY WIDTH; FINITE DISTANCE; FOCAL LENGTHS; FRESNEL DIFFRACTION THEORY; GRAZING ANGLES; HARD X RAY; HARD X-RAY IMAGING; HARD X-RAY OPTICS; IMAGING CAPABILITIES; IN-FLIGHT PERFORMANCE; METROLOGY DATA; MIRROR SHELLS; MONOCHROMATIC X-RAYS; NHXM; NICKEL ELECTROFORMING; OPTICS CALIBRATION; PENCIL BEAM; POINT-SPREAD FUNCTIONS; SPRING-8; SYNCHROTRON RADIATION FACILITY; TEST CAMPAIGN; X RAY BANDS; X RAY TELESCOPE; X-RAY FLUX; X-RAY SOURCES;

ASTRONOMY; DIFFRACTION; ELECTROFORMING; MIRRORS; OPTICAL TELESCOPES; OPTICAL TESTING; OPTICAL TRANSFER FUNCTION; OPTICS; REFLECTIVE COATINGS; TELESCOPES; X RAYS;

GAMMA RAYS;

EID: 80355149034     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.894488     Document Type: Conference Paper

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