Current status of hard x-ray characterization of ASTRO-H HXT at SPring-8

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7732, Issue , 2010, Pages

  Miyazawa, Takuya ^a   Furuzawa, Akihiro ^a   Kanou, Yasufumi ^a   Matsuda, Kenji ^a   Sakai, Michito ^a   Yamane, Nobuyuki ^a   Ishida, Yousuke ^a   Hara, Shinji ^a   Miyata, Yusuke ^a   Sakanobe, Karin ^a   Haba, Yoshito ^a   Matsumoto, Hironori ^a   Tawara, Yuzuru ^a   Kunieda, Hideyo ^a   Mori, Hideyuki ^b   Tamura, Keisuke ^a   Maeda, Yoshitomo ^a   Ishida, Manabu ^a   Awaki, Hisamitsu ^c   Okajima, Takashi ^d   Uesugi, Kentaro ^e   Suzuki, Yoshio ^e   Ishida, Naoki ^f   Ohtsu, Nobuhiro ^f   Suzuki, Akio ^f   Ogasaka, Yasushi ^g   Yamashita, Koujun ^g   more..

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c EHIME UNIVERSITY   (Japan)

^d NASA GODDARD SPACE FLIGHT CENTER   (United States)

^e JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^f Tamagawa Engineering Co Ltd   (Japan)

^g JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

ASTRO H; Hard x ray telescope; Multilayer optics; Synchrotron facility

Indexed keywords

ASTRO-H; BEAM LINES; CURRENT STATUS; HARD X RAY; HARD X-RAY TELESCOPE; MIRROR PRODUCTION; MULTILAYER OPTICS; MULTILAYER REFLECTORS; REFLECTOR SURFACES; REPLICATION METHOD; SPRING-8; TEST PRODUCTION; X RAY SATELLITES;

INSTRUMENTS; MULTILAYERS; OPTICAL TELESCOPES; OPTICAL TESTING; REFLECTION; SPACE TELESCOPES; SPACECRAFT EQUIPMENT; SYNCHROTRONS; X RAYS;

GAMMA RAYS;

EID: 77957879369     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.857421     Document Type: Conference Paper

References (11)

1. Furuzawa, A., et al., 2010, Proc. of SPIE, in this proceeding
2. Goto, S., et al., 2001, Nucl. Instrum. Methods, A467, 682
3. Kunieda, H., et al., 2006, Proc. of SPIE, Vol. 6266, 62660B
4. Kunieda, H., et al., 2010, Proc. of SPIE, in this proceeding
5. Ogasaka, Y., et al., 2003, Proc. of SPIE, Vol. 4851, 619
6. Ogasaka, Y., et al., 2005, Proc. of SPIE, Vol. 5900, 106
7. Ogasaka, Y., et al., 2007, Proc. of SPIE, Vol. 7011, 70110P
8. Ogasaka, Y., et al., 2008, Jpn. J. Appl. Phys. Vol. 47, No.7, 5743
9. Miyazawa, T., et al., 2006, Proc. of SPIE, Vol. 6266, 62663C
10. Miyazawa, T., et al., 2008, Proc. of SPIE, Vol. 7011, 70112P
11. Takahashi, T., et al., 2010, Proc. of SPIE, in this proceeding