Huge (but finite) time scales in slow relaxations: Beyond simple aging

Physical Review Letters

Volumn 107, Issue 18, 2011, Pages

  Amir, Ariel ^a,b   Borini, Stefano ^c   Oreg, Yuval ^a   Imry, Yoseph ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b HARVARD UNIVERSITY   (United States)

^c ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; FITTING PARAMETERS; GENERIC THEORY; GLASSY EFFECTS; ROOM TEMPERATURE; SLOW RELAXATIONS; STRONG ELECTRIC FIELDS; THEORETICAL RESULT; TIME-SCALES;

CURVE FITTING; ELECTRIC FIELDS; POROUS SILICON; RELAXATION PROCESSES;

TIME MEASUREMENT;

EID: 80155143143     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.186407     Document Type: Article

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