Slow conductance relaxation in granular aluminium films

Physica Status Solidi C: Conferences

Volumn 1, Issue 1, 2004, Pages 9-12

  Grenet, T ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CAPACITANCE; ELECTRIC CONDUCTANCE; ELECTRIC INSULATORS; ELECTRIC POTENTIAL; EVAPORATION; GRAIN SIZE AND SHAPE; GRANULAR MATERIALS; HIGH TEMPERATURE EFFECTS; IMAGE ANALYSIS; INDIUM COMPOUNDS; MICROSTRUCTURE; MOS CAPACITORS; PERTURBATION TECHNIQUES; SCANNING TUNNELING MICROSCOPY;

ACTIVATION LAW; GRANULAR METALS; RESISTANCE RATIOS; SLOW CONDUCTANCE RELAXATION;

THIN FILMS;

EID: 2342563082     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303622     Document Type: Conference Paper

References (8)

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