Mode i type delamination fracture toughness of YBCO coated conductor with additional Cu layer

Physica C: Superconductivity and its Applications

Volumn 471, Issue 21-22, 2011, Pages 1071-1074

  Miyazato, T ^a   Hojo, M ^a   Sugano, M ^a   Adachi, T ^b   Inoue, Y ^a   Shikimachi, K ^c   Hirano, N ^c   Nagaya, S ^c  

^a KYOTO UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c CHUBU ELECTRIC POWER CO INC   (Japan)

Author keywords

Delamination; Fracture mechanism; Fracture toughness; YBCO coated conductor with an additional Cu layer

Indexed keywords

COMPLEX STRESS INTENSITY FACTOR; COMPOSITION ANALYSIS; CU LAYERS; DELAMINATION FRACTURE; DOUBLE CANTILEVER BEAM; ENERGY DISPERSIVE X-RAY; FRACTURE MECHANISM; FRACTURE MECHANISMS; FRACTURE TOUGHNESS TESTS; INTERLAMINAR FRACTURE; MAIN CRACK; MICROSCOPIC OBSERVATIONS; PRE-CRACKS; SCANNING ELECTRON MICROSCOPES; YBCO COATED CONDUCTORS; YBCO LAYER;

CANTILEVER BEAMS; CRACKS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FATIGUE OF MATERIALS; FRACTURE; SCANNING ELECTRON MICROSCOPY; STEEL SHEET; YTTRIUM BARIUM COPPER OXIDES;

FRACTURE TOUGHNESS;

EID: 80055001111     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2011.05.126     Document Type: Conference Paper

References (24)

1. N. Cheggour, J.W. Ekin, and C.L.H. Thieme IEEE Trans. Appl. Supercond. 15 2005 3577
2. M. Sugano, T. Nakamura, T. Manabe, K. Shikimachi, N. Hirano, and S. Nagaya Supercond. Sci. Technol. 21 2008 115019
3. N. Cheggour, J.W. Ekin, C.L.H. Thieme, Y.Y. Xie, V. Selvamanickam, and R. Feenstra Supercond. Sci. Technol. 18 2005 S319
4. H.S. Shin, K.H. Kim, J.R.C. Dizon, T.Y. Kim, R.K. Ko, and S.S. Oh Supercond. Sci. Technol. 18 2005 S364
5. K. Shikimachi, N. Hirano, S. Nagaya, H. Kawashima, K. Higashikawa, and T. Nakamura IEEE Trans. Appl. Supercond. 19 2009 2012
6. N. Cheggour, J.W. Ekin, C.C. Clickner, D.T. Verebelyi, C.L.H. Thieme, R. Feenstra, and A. Goyal Appl. Phys. Lett. 83 2003 4223
7. D.C. van der Laan, and J.W. Ekin Supercond. Sci. Technol. 21 2008 115002
8. A.L. Mbaruku, and J. Schwartz IEEE Trans. Appl. Supercond. 18 2008 1743
9. Y. Yoshida, M. Hojo, M. Sugano, T. Adachi, Y. Inoue, K. Shikimachi, N. Hirano, and S. Nagaya Physica C 469 2009 1476
10. Z. Suo, and J.W. Hutchinson Int. J. Fract. 43 1990 1
11. G. Nishijima, H. Oguro, S. Awaji, K. Watanabe, K. Shikimachi, N. Hirano, and S. Nagaya IEEE Trans. Appl. Supercond. 18 2008 1131
12. T. Takematsu, R. Hu, T. Takao, Y. Yanagisawa, H. Nakagome, D. Uglietti, T. Kiyoshi, M. Takahashi, and H. Maeda Physica C 470 2010 674
13. D.C. van der Laan, J.W. Ekin, C.C. Clickner, and T.C. Stauffer Supercond. Sci. Technol. 20 2007 765
14. M. Sugano, T. Nakamura, K. Shikimachi, N. Hirano, and S. Nagaya IEEE Trans. Appl. Supercond. 17 2007 3067
15. K. Kageyama, T. Kobayashi, and T.W. Chou Composites 18 1987 393
16. F. Erdogan J. Appl. Mech. 32 1965 403
17. R. Yuuki, and S.B. Cho Eng. Fract. Mech. 34 1989 179
18. T. Ikeda, N. Miyazaki, and T. Soda Eng. Fract. Mech. 59 1998 725
19. Y. Yoshida, M. Hojo, M. Sugano, T. Adachi, Y. Inoue, S. Nagaya, in: Proceedings of the 2008 Annual Meeting of the JSME/MMD, 2008, OS0615 (CD-ROM).
20. Y. Yoshino, A. Iwabuchi, K. Noto, N. Sakai, and M. Murakami Physica C 357-360 2001 796
21. A.G. Evans, and B.J. Dalgleish Acta Metall. Mater. 40 1992 S295
22. H. Huang, and F. Spaepen Acta Mater. 48 2000 3261
23. A. Nakajima, A. Yoshihara, and M. Ishigame Phys. Rev. B 50 1994 13297
24. M.P. van Dijk, K.J. de Vries, and A.J. Burggraaf Solid State Ionics 9-10 1983 913