Adhesion between submicrometer polystyrene spheres

Powder Technology

Volumn 214, Issue 3, 2011, Pages 447-450

  Wang, Xiao Dong ^a   Chen, Bo ^a   Wang, Hai Feng ^a   Wang, Zhan Shan ^b  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Adhesion; Plastic deformation; Polystyrene spheres

Indexed keywords

CONTACT METHODS; CONTACT RADIUS; POLYSTYRENE PARTICLE; POLYSTYRENE SPHERES; SCANNING ELECTRON MICROSCOPES; SUBMICROMETERS; VAN DER WAALS INTERACTIONS;

ADHESION; PLASTIC DEFORMATION; POLYSTYRENES; SCANNING ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

SPHERES;

MICROSPHERE; PLASTIC; POLYSTYRENE;

ADHESION; ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CONTACT ANGLE; CONTROLLED STUDY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MATHEMATICAL MODEL; MOLECULAR INTERACTION; PARTICLE SIZE; PHYSICAL CHEMISTRY; PLASTICITY; PROCESS DESIGN; SURFACE PROPERTY; TOTAL QUALITY MANAGEMENT; YOUNG MODULUS;

EID: 80054861891     PISSN: 00325910     EISSN: 1873328X     Source Type: Journal    
DOI: 10.1016/j.powtec.2011.08.047     Document Type: Article

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