Exposing image forgery with blind noise estimation

MM and Sec'11 - Proceedings of the 2011 ACM SIGMM Multimedia and Security Workshop

Volumn , Issue , 2011, Pages 15-20

  Pan, Xunyu ^a   Zhang, Xing ^a   Lyu, Siwei ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

image forensics; noise estimation; unsupervised learning

Indexed keywords

COARSE-TO-FINE; DETECTION ACCURACY; FALSE POSITIVE RATES; HIGH QUALITY IMAGES; IMAGE BLOCKS; IMAGE FORENSICS; IMAGE FORGERY; IMAGE TAMPERING; IMAGING DEVICE; IMAGING PROCESS; NOISE ESTIMATION; NOISE LEVELS; NOISE VARIANCE; ORIGINAL IMAGES; PRIOR INFORMATION; VISUAL EFFECTS;

SPURIOUS SIGNAL NOISE;

EID: 80054782322     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2037252.2037256     Document Type: Conference Paper

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