|
Volumn 258, Issue 1, 2011, Pages 201-206
|
Formation of CuO nanowires by thermal annealing copper film deposited on Ti/Si substrate
|
Author keywords
CuO nanowires; Electron beam evaporation; Growth mechanism; Thermal annealing
|
Indexed keywords
ANNEALING;
COPPER;
ELECTRON BEAMS;
EVAPORATION;
FILM GROWTH;
METALLIC FILMS;
NANOWIRES;
OXIDE FILMS;
PHYSICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THERMOOXIDATION;
THIN FILMS;
TITANIUM COMPOUNDS;
ANNEALING TEMPERATURES;
CUO NANOWIRES;
ELECTRON BEAM EVAPORATION;
GROWTH MECHANISMS;
INORGANIC MATERIALS;
STRUCTURE CHARACTERIZATION;
THERMAL-ANNEALING;
VAPOR SOLID MECHANISM;
COPPER OXIDES;
|
EID: 80054754241
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2011.08.031 Document Type: Article |
Times cited : (39)
|
References (22)
|