Cross-sectional characterization of cupric oxide nanowires grown by thermal oxidation of copper foils

Applied Surface Science

Volumn 257, Issue 1, 2010, Pages 62-66

  Liang, Jianbo ^a   Kishi, Naoki ^a   Soga, Tetsuo ^a   Jimbo, Takashi ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Cross sectional analysis; CuO; EDX; Nanowires

Indexed keywords

COPPER; ELECTROCHEMICAL ELECTRODES; ENERGY DISPERSIVE SPECTROSCOPY; METAL CLADDING; NANOWIRES; SCANNING ELECTRON MICROSCOPY; THERMOOXIDATION; X RAY DIFFRACTION;

AMBIENT CONDITIONS; ANNEALING TEMPERATURES; COPPER FOILS; CROSS SECTIONAL ANALYSIS; CUO NANOWIRES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FIELD EMISSION SEM; THERMAL OXIDATION;

COPPER OXIDES;

EID: 77955515868     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.06.034     Document Type: Article

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