A novel method for preparation of pure Bi2SiO5 crystals

Materials Letters

Volumn 67, Issue 1, 2012, Pages 280-282

  Guo, H W ^a,b   Wang, X F ^a   Gao, D N ^a  

^a SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

Crystal growth; Sintering; X ray techniques

Indexed keywords

COARSE GRAINS; DIFFERENTIAL SCANNING CALORIMETERS; EXOTHERMIC PEAKS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HEATING PROCESS; MELT COOLING; PREPARATION AND PROPERTIES; SEM IMAGE; X-RAY TECHNIQUES; XRD;

CRYSTAL GROWTH; CRYSTALS; DIFFERENTIAL SCANNING CALORIMETRY; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY DIFFRACTION;

SILICON COMPOUNDS;

EID: 80054740983     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.09.088     Document Type: Article

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