Migration of the Σ7 tilt grain boundary in Al under an applied external stress

Scripta Materialia

Volumn 65, Issue 11, 2011, Pages 990-993

  Molodov, Dmitri A ^a   Gorkaya, Tatiana ^a   Gottstein, Günter ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Bicrystal; Grain boundary migration; In situ measurements; SEM; Shear stress

Indexed keywords

APPLIED STRESS; CSL BOUNDARY; EXTERNAL STRESS; GRAIN BOUNDARY MIGRATION; IN SITU MEASUREMENTS; IN-SITU OBSERVATIONS; MIGRATION RATES; MISORIENTATIONS; SCANNING ELECTRON MICROSCOPE; TEMPERATURE DEPENDENCE; THEORETICAL PREDICTION; TILT GRAIN BOUNDARY;

GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY;

GRAIN BOUNDARIES;

EID: 80054029754     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.08.030     Document Type: Article

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