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Volumn , Issue , 2010, Pages 567-570

Thermal mechanical noise based characterization of CMUTs using monolithically integrated low noise receiver electronics

Author keywords

CMUT noise; electronics integration

Indexed keywords

A-THERMAL; ARRAY ELEMENTS; CMUT NOISE; DC BIAS; DETECTION SYSTEM; ELECTRICAL IMPEDANCE; FORWARD LOOKING; INTEGRATED SYSTEMS; LOW NOISE RECEIVERS; MECHANICAL NOISE; MONOLITHIC INTEGRATION; MONOLITHICALLY INTEGRATED; NOISE MEASUREMENTS; NOISE SPECTRA; PARASITICS; RESONANCE FREQUENCIES; SYSTEM NOISE; TRANSDUCER NOISE; TRANSIMPEDANCE AMPLIFIERS; VOLUMETRIC IMAGING;

EID: 80054013235     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULTSYM.2010.5935987     Document Type: Conference Paper
Times cited : (6)

References (6)
  • 1
    • 44349109407 scopus 로고    scopus 로고
    • Characterization and noise analysis of capacitive MEMS acoustic emission transducers
    • W. Wei, D. W. Greve, and I. J. Oppenheim, "Characterization and Noise Analysis of Capacitive MEMS Acoustic Emission Transducers," in Sensors, 2007 IEEE, 2007, pp. 1152-1155.
    • (2007) Sensors 2007 IEEE , pp. 1152-1155
    • Wei, W.1    Greve, D.W.2    Oppenheim, I.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.