Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface

Journal of Instrumentation

Volumn 6, Issue 9, 2011, Pages

  Ping, Y ^a   Landen, L ^a   Hicks, G ^a   Koch, A ^a   Wallace, R ^a   Sorce, C ^a   Hammel, A ^a   Collins, W ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Plasma diagnostics interferometry; Spectroscopy and imaging; X ray radiography and digital radiography (DR)

Indexed keywords

EID: 80053623835     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/6/09/P09004     Document Type: Article

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