A small-angle X-ray scattering study and molecular dynamics simulation of microvoid evolution during the tensile deformation of carbon fibers

Carbon

Volumn 50, Issue 1, 2012, Pages 235-243

  Zhu, Caizhen ^a,b,c   Liu, Xiaofang ^a,c   Yu, Xiaolan ^a,c   Zhao, Ning ^a   Liu, Jianhong ^b   Xu, Jian ^a  

^a INSTITUTE OF CHEMISTRY   (China)

^b SHENZHEN UNIVERSITY   (China)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BOND ANGLE; DAMAGE POINT; FIBER AXIS; LONG-RANGE STRUCTURES; MICRO VOIDS; MICROVOID; MOLECULAR DYNAMICS SIMULATIONS; ORIENTATION ANGLES; SHORT-RANGE STRUCTURE; SMALL ANGLE X-RAY SCATTERING; STRESS RELEASE; STRESS STRAIN RELATION; TENSILE DEFORMATION;

BOND LENGTH; DEFORMATION; DYNAMICS; MOLECULAR DYNAMICS; MOLECULAR MECHANICS; SCATTERING; STRESS CONCENTRATION; STRESS-STRAIN CURVES; X RAY SCATTERING;

CARBON FIBERS;

EID: 80053582554     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2011.08.040     Document Type: Conference Paper

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