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Volumn 196, Issue 23, 2011, Pages 9989-9997

Effect of Ni content in SOFC Ni-YSZ cermets: A three-dimensional study by FIB-SEM tomography

Author keywords

Effective properties; FIB; Percolation threshold; SOFC; Tomography; Tortuosity

Indexed keywords

3D RECONSTRUCTION; CONDUCTING PHASE; EFFECTIVE CONDUCTIVITY; EFFECTIVE PROPERTY; ELECTRIC PERCOLATION; ELECTRICAL CONDUCTIVITY; ELECTROCHEMICAL ACTIVITIES; ELECTRONIC CONDUCTIVITY; EXPERIMENTAL MEASUREMENTS; FIB; FOCUSED ION BEAM-SCANNING ELECTRON MICROSCOPIES; NI CONTENT; NI-YSZ CERMETS; OPTIMAL COMPOSITION; PASSIVE VOLTAGE CONTRASTS; PERCOLATION THRESHOLDS; SERIAL SECTIONING; SURFACE AREA; THREE PHASE BOUNDARY; THREE-DIMENSIONAL MICROSTRUCTURES; TORTUOSITY; VOLUMETRIC RATIO;

EID: 80053562549     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2011.07.010     Document Type: Article
Times cited : (86)

References (37)
  • 27
    • 80053569332 scopus 로고    scopus 로고
    • http://www.vsg3d.com.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.