Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals

Optoelectronics Letters

Volumn 7, Issue 5, 2011, Pages 346-349

  Yang, Ming yang ^a   Zhou, Jun ^a   Petti, L ^b   de Nicola, S ^c   Mormile, P ^b  

^a NINGBO UNIVERSITY   (China)

^b CNR   (Italy)

^c ISTITUTO NAZIONALE DI OTTICA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FAR FIELD DIFFRACTION PATTERN; FRACTAL CHARACTERISTICS; INFLATION RULE; OPTICAL DIFFRACTIONS; POTENTIAL APPLICATIONS; THUE-MORSE;

DIFFRACTION PATTERNS; FRACTALS; INTERFEROMETRY; TWO DIMENSIONAL;

NUMERICAL METHODS;

EID: 80053518722     PISSN: 16731905     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11801-011-1057-0     Document Type: Article

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